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142
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STACS
2000
Springer
15 years 9 months ago
2000
Springer
We clarify the computational complexity of planarity testing, by showing that planarity testing is hard for L, and lies in SL. This nearly settles the question, since it is widely...
167
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DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
149
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PTS
1998
15 years 7 months ago
1998
Based on the notion of event-based behavioral abstraction EBBA we specify properties of object-oriented distributed systems in linear time temporal logic. These properties are the...
168
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IOLTS
2007
IEEE
16 years 11 days ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
157
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ICCD
1999
IEEE
15 years 10 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...