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ITC
1997
IEEE
73views Hardware» more  ITC 1997»
15 years 10 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
VEE
2012
ACM
269views Virtualization» more  VEE 2012»
14 years 1 months ago
SimTester: a controllable and observable testing framework for embedded systems
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
Tingting Yu, Witawas Srisa-an, Gregg Rothermel
140
Voted
ICASSP
2009
IEEE
16 years 25 days ago
Testing fractal connectivity in multivariate long memory processes
Within the framework of long memory multivariate processes, fractal connectivity is a particular model, in which the low frequencies (coarse scales) of the interspectrum of each p...
Herwig Wendt, Antoine Scherrer, Patrice Abry, Soph...
ACCESSNETS
2008
Springer
16 years 13 days ago
Loop Identification and Capacity Estimation of Digital Subscriber Lines with Single Ended Line Testing
Digital subscriber lines offer the possibility to deliver broadband services over the existing telephone network. Still, beforehand subscriber loops must be tested to see whether t...
Carine Neus, Wim Foubert, Leo Van Biesen
ISPW
2006
IEEE
16 years 3 days ago
Automated Recognition of Low-Level Process: A Pilot Validation Study of Zorro for Test-Driven Development
Abstract. Zorro is a system designed to automatically determine whether a developer is complying with the Test-Driven Development (TDD) process. Automated recognition of TDD could ...
Hongbing Kou, Philip M. Johnson