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AIS
2004
Springer
15 years 3 months ago
2004
Springer
Abstract. Model verification examines the correctness of a model implementation with respect to a model specification. While being described from model specification, implementatio...
DATE
2003
IEEE
15 years 5 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
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ICST
2009
IEEE
14 years 9 months ago
2009
IEEE
This paper studies the problem of model-based testing of real-time systems that are only partially observable. We model the System Under Test (SUT) using Timed Game Automata (TGA)...
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
APSEC
2004
IEEE
15 years 3 months ago
2004
IEEE
Testing concurrent software is difficult due to problems with inherent non-determinism. In previous work, we have presented a method and tool support for the testing of concurrent...