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146
Voted
DATE
1998
IEEE
15 years 10 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
139
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DATE
2006
IEEE
16 years 6 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
125
Voted
WABI
2001
Springer
15 years 10 months ago
2001
Springer
There are very few instances in which positive Darwinian selection has been convincingly demonstrated at the molecular level. In this study, we present a novel test for detecting p...
150
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ISSRE
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper investigates the precision of three linearcomplexity type analyses for Java software: Class Hierarchy Analysis (CHA), Rapid Type Analysis (RTA) and Variable Type Analys...
150
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CIKM
2007
Springer
15 years 10 months ago
2007
Springer
Information retrieval experimentation generally proceeds in a cycle of development, evaluation, and hypothesis testing. Ideally, the evaluation and testing phases should be short ...