4305 search results - page 135 / 861 » The Test of Time |
166
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
143
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CORR
2010
Springer
15 years 6 months ago
2010
Springer
Non-adaptive group testing involves grouping arbitrary subsets of n items into different pools. Each pool is then tested and defective items are identified. A fundamental question...
138
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SIGSOFT
2003
ACM
16 years 7 months ago
2003
ACM
Although a software application always executes within a particular environment, current testing methods have largely ignored these environmental factors. Many applications execut...
165
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ISVLSI
2007
IEEE
16 years 15 days ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
156
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COR
2008
2008
Observations in using parallel and sequential evolutionary algorithms for automatic software testing
15 years 6 months ago
In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...