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» The Test of Time
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ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
15 years 11 months ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
DATE
2003
IEEE
130views Hardware» more  DATE 2003»
15 years 11 months ago
A Technique for High Ratio LZW Compression
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
Michael J. Knieser, Francis G. Wolff, Christos A. ...
DATE
2008
IEEE
76views Hardware» more  DATE 2008»
16 years 22 days ago
Signal Probability Based Statistical Timing Analysis
VLSI timing analysis and power estimation target the same circuit switching activity. Power estimation techniques are categorized as (1) static, (2) statistical, and (3) simulatio...
Bao Liu
CHI
2005
ACM
15 years 8 months ago
Dealing with system response times in interactive speech applications
In this user study, we address several open issues in the design of waiting cues for system response time (SRT) in interactive telephony speech applications. User observations and...
Peter Fröhlich
ERLANG
2006
ACM
16 years 7 days ago
Testing telecoms software with quviq QuickCheck
We present a case study in which a novel testing tool, Quviq QuickCheck, is used to test an industrial implementation of the Megaco protocol. We considered positive and negative t...
Thomas Arts, John Hughes, Joakim Johansson, Ulf Wi...