The service-oriented approach is becoming more and more popular to integrate highly heterogeneous systems. Web services are the natural evolution of conventional middleware techno...
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
An optimization method is introduced for generating minimum-length test sequences taking into account timing constraints for FSM models of communication protocols. Due to active t...
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already ...