Sciweavers

4305 search results - page 13 / 861
» The Test of Time
Sort
View
ICWS
2010
IEEE
14 years 10 months ago
Timed Extended Invariants for the Passive Testing of Web Services
The service-oriented approach is becoming more and more popular to integrate highly heterogeneous systems. Web services are the natural evolution of conventional middleware techno...
Gerardo Morales, Stéphane Maag, Ana R. Cava...
VTS
2005
IEEE
95views Hardware» more  VTS 2005»
15 years 5 months ago
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Baosheng Wang, Yuejian Wu, Josh Yang, André...
CN
1999
100views more  CN 1999»
14 years 11 months ago
Testing protocols modeled as FSMs with timing parameters
An optimization method is introduced for generating minimum-length test sequences taking into account timing constraints for FSM models of communication protocols. Due to active t...
M. Ümit Uyar, Mariusz A. Fecko, Adarshpal S. ...
DATE
2004
IEEE
120views Hardware» more  DATE 2004»
15 years 3 months ago
Pattern Selection for Testing of Deep Sub-Micron Timing Defects
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng
SDL
2001
89views Hardware» more  SDL 2001»
15 years 1 months ago
Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation
The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already ...
Dieter Hogrefe, Beat Koch, Helmut Neukirchen