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ICCAD
2006
IEEE
134views Hardware» more  ICCAD 2006»
16 years 3 months ago
A delay fault model for at-speed fault simulation and test generation
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
Irith Pomeranz, Sudhakar M. Reddy
QSIC
2003
IEEE
15 years 11 months ago
Generating Small Combinatorial Test Suites to Cover Input-Output Relationships
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
Christine Cheng, Adrian Dumitrescu, Patrick J. Sch...
ICWS
2010
IEEE
15 years 7 months ago
WebMov: A Dedicated Framework for the Modelling and Testing of Web Services Composition
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...
Ana R. Cavalli, Tien-Dung Cao, Wissam Mallouli, El...
VLSID
1997
IEEE
135views VLSI» more  VLSID 1997»
15 years 10 months ago
Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxen...
207
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IFIP
2000
Springer
15 years 10 months ago
Test Case Design for the Validation of Component-Based Embedded Systems
The validation of functional and real-time requirements of control software for embedded systems is a difficult task. It usually needs the electronic control unit (ECU) and the co...
W. Fleisch