4305 search results - page 17 / 861 » The Test of Time |
GD
2003
Springer
15 years 5 months ago
2003
Springer
A graph with an ordered k-partition of the vertices is radial level planar if there is a strictly outward drawing on k concentric levels without crossings. Radial level planarity ...
VTS
2002
IEEE
15 years 4 months ago
2002
IEEE
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...
DATE
2007
IEEE
15 years 6 months ago
2007
IEEE
Economic testing of small devices like LCD drivers is a real challenge. In this paper we describe an approach where a production tester is extended by a memory test engine (MTE). ...
VTS
1997
IEEE
15 years 4 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
102
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RTS
1998
14 years 11 months ago
1998
When developing multitasking real-time systems, schedulability tests are used to formally prove that a given task set will meet its deadlines. A wide range of such tests have appe...