Sciweavers

4305 search results - page 24 / 861
» The Test of Time
Sort
View
ECOOP
2003
Springer
15 years 11 months ago
Java Subtype Tests in Real-Time
Krzysztof Palacz, Jan Vitek
ITC
1998
IEEE
79views Hardware» more  ITC 1998»
15 years 10 months ago
An almost full-scan BIST solution-higher fault coverage and shorter test application time
Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng