4305 search results - page 29 / 861 » The Test of Time |
102
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ICCAD
2004
IEEE
15 years 10 months ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
115
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VLSID
2002
IEEE
16 years 2 months ago
2002
IEEE
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
Software-based self-test (SBST) of processors offers many benefits, such as dispense with expensive test equipments, test execution during maintenance and in the field or initiali...
100
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GI
2007
Springer
15 years 8 months ago
2007
Springer
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
131
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IESS
2007
Springer
15 years 8 months ago
2007
Springer
: The performance of feasibility tests is crucial in many applications. When using feasibility tests online only a limited amount of analysis time is available. Run-time efficiency...