4305 search results - page 30 / 861 » The Test of Time |
VTS
2007
IEEE
15 years 8 months ago
2007
IEEE
When a test set size is larger than desired, some patterns must be dropped. This paper presents a systematic method to reduce test set size; the method reorders a test set using t...
125
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KES
2008
Springer
15 years 1 months ago
2008
Springer
Software testing is an integral part of software engineering. Lack of testing often leads to disastrous consequences including loss of data, fortunes, and even lives. In order to e...
101
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VTS
2003
IEEE
15 years 7 months ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...
106
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DATE
2007
IEEE
15 years 8 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
ERSHOV
2006
Springer
15 years 5 months ago
2006
Springer
Abstract. TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software i...