4305 search results - page 31 / 861 » The Test of Time |
ISQED
2003
IEEE
15 years 7 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
120
Voted
EURODAC
1995
IEEE
15 years 5 months ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
108
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DFT
2003
IEEE
15 years 7 months ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
145
Voted
ECRTS
2006
IEEE
15 years 8 months ago
2006
IEEE
The multiprocessor scheduling of collections of real-time jobs is considered. Sufficient tests are derived for determining whether a given collection of jobs can be scheduled to m...
130
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DSD
2005
IEEE
15 years 7 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...