4305 search results - page 32 / 861 » The Test of Time |
116
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DATE
2002
IEEE
15 years 7 months ago
2002
IEEE
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...
177
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ATAL
2008
Springer
15 years 4 months ago
2008
Springer
We introduce eCAT, a tool that supports deriving test cases semi-automatically from goal-based analysis diagrams, generates meaningful test inputs based on agent interaction ontol...
123
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IJCSA
2007
15 years 1 months ago
2007
Timed Concurrent State Machines are an application of Alur’s Timed Automata concept to coincidence-based (rather than interleaving) CSM modeling technique. TCSM support the idea...
DATE
2007
IEEE
15 years 8 months ago
2007
IEEE
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
109
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ASPDAC
2007
ACM
15 years 6 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...