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139
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FEDCSIS
2011
14 years 1 months ago
2011
Abstract—The Future Internet will be a complex interconnection of services, applications, content and media, on which our society will become increasingly dependent. Time to mark...
124
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TCAD
2008
15 years 1 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
143
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WISES
2003
15 years 3 months ago
2003
— Testing and verification are important methods for gaining confidence in the reliability of a software product. Keeping this confidence up is especially difficult for softw...
104
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MTV
2007
IEEE
15 years 8 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
116
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VTS
2007
IEEE
15 years 8 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...