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VLSI
2005
Springer
15 years 7 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom
TSE
2002
119views more  TSE 2002»
15 years 1 months ago
Testing Homogeneous Spreadsheet Grids with the "What You See Is What You Test" Methodology
Although there has been recent research into ways to design environments that enable end users to create their own programs, little attention has been given to helping these end u...
Margaret M. Burnett, Andrei Sheretov, Bing Ren, Gr...
MANSCI
2010
54views more  MANSCI 2010»
15 years 12 days ago
Time-Tradeoff Sequences for Analyzing Discounting and Time Inconsistency
This paper introduces time-tradeoff (TTO) sequences as a new tool to analyze time inconsistency and intertemporal choice. TTO sequences simplify the measurement of discount functio...
Arthur E. Attema, Han Bleichrodt, Kirsten I. M. Ro...
COCO
2004
Springer
86views Algorithms» more  COCO 2004»
15 years 7 months ago
Deterministic Polynomial Identity Testing in Non-Commutative Models
We give a deterministic polynomial time algorithm for polynomial identity testing in the following two cases:
Ran Raz, Amir Shpilka
ICST
2008
IEEE
15 years 8 months ago
Prioritizing User-Session-Based Test Cases for Web Applications Testing
Web applications have rapidly become a critical part of business for many organizations. However, increased usage of web applications has not been reciprocated with corresponding ...
Sreedevi Sampath, Renée C. Bryce, Gokulanan...