4305 search results - page 37 / 861 » The Test of Time |
106
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KBSE
2003
IEEE
15 years 7 months ago
2003
IEEE
Test designers widely believe that the overall effectiveness and cost of software testing depends largely on the type and number of test cases executed on the software. In this pa...
ICSM
2005
IEEE
15 years 7 months ago
2005
IEEE
Software testing is a critical part of software development. Test suite sizes may grow significantly with subsequent modifications to the software over time. Due to time and res...
121
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KDD
2000
ACM
15 years 5 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
126
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DSD
2010
IEEE
15 years 2 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
118
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ITC
1998
IEEE
15 years 6 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...