4305 search results - page 38 / 861 » The Test of Time |
129
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EDM
2010
15 years 16 days ago
2010
Dynamic assessment (DA) has been advocated as an interactive approach to conduct assessments to students in the learning systems as it can differentiate student proficiency at a fi...
117
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DAC
2007
ACM
16 years 3 months ago
2007
ACM
The test time for core-external interconnect shorts/opens is typically much less than that for core-internal logic. Therefore, prior work on test infrastructure design for core-ba...
116
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VTS
2007
IEEE
15 years 8 months ago
2007
IEEE
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
DELTA
2006
IEEE
15 years 8 months ago
2006
IEEE
— Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnost...
123
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SDM
2010
SIAM
15 years 3 months ago
2010
SIAM
We present Confidence-based Feature Acquisition (CFA), a novel supervised learning method for acquiring missing feature values when there is missing data at both training and test...