4305 search results - page 41 / 861 » The Test of Time |
156
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VTS
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
165
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AICCSA
2008
IEEE
16 years 5 days ago
2008
IEEE
Time Petri nets with stopwatches not only model system/environment interactions and time constraints. They further enable modeling of suspend/resume operations in real-time system...
130
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ETS
2006
IEEE
15 years 11 months ago
2006
IEEE
This paper proposes a wrapper design for interconnects with guaranteed bandwidth and latency services and on-chip protocol. strate that these interconnects abstract the interconne...
156
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ATS
2001
IEEE
15 years 9 months ago
2001
IEEE
Test access is a major problem for core-based systemon-chip (SOC) designs. Since cores in an SOC are not directly accessible via chip inputs and outputs, special access mechanisms...
147
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ATS
2009
IEEE
16 years 15 days ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...