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152
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ETS
2006
IEEE
15 years 11 months ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
151
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DEBU
2008
15 years 5 months ago
2008
Testing is one of the most expensive and time consuming activities in the software development cycle. In order to reduce the cost and the time to market, many approaches to automa...
134
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ICCAD
1994
IEEE
15 years 9 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
146
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SODA
2010
ACM
16 years 3 months ago
2010
ACM
We consider the problem of testing whether the maximum additive integrality gap of a family of integer programs in standard form is bounded by a given constant. This can be viewed...