4305 search results - page 47 / 861 » The Test of Time |
136
click to vote
DATE
2002
IEEE
15 years 10 months ago
2002
IEEE
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...
126
click to vote
ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
114
click to vote
ETS
2006
IEEE
15 years 9 months ago
2006
IEEE
This paper presents a new on-chip time measurement architecture which is based on the Timeto-Digital Conversion (TDC) method that is capable of achieving a timing resolution of te...
126
click to vote
JAMDS
2002
15 years 5 months ago
2002
Under traditional cointegration tests, some eligible I(1) time series systems Xt, that are not cointegrated over a given time period, say (0, T1], sometimes test as cointegrated ov...
203
click to vote
DELTA
2006
IEEE
15 years 9 months ago
2006
IEEE
This paper describes the concept, architecture, development and demonstration of a real time, high performance, software defined 4-receiver system and a space time decoder to be i...