4305 search results - page 48 / 861 » The Test of Time |
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DATE
2006
IEEE
15 years 11 months ago
2006
IEEE
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that consists of cores with different clock frequencies during test. We also propose a t...
177
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ETS
2010
IEEE
15 years 6 months ago
2010
IEEE
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
155
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AAAI
2007
15 years 8 months ago
2007
We investigate the impact of time on the predictability of sentiment classification research for models created from web logs. We show that sentiment classifiers are time dependen...
152
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CSSC
2010
15 years 5 months ago
2010
Testing the fractionally integrated order of seasonal and non-seasonal unit roots is quite important for the economic and financial time series modelling. In this paper, Robinson ...
171
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TVLSI
2010
15 years 12 days ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...