4305 search results - page 49 / 861 » The Test of Time |
136
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SERA
2005
Springer
15 years 11 months ago
2005
Springer
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for n...
137
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ITC
1998
IEEE
15 years 10 months ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
129
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ICCD
2004
IEEE
16 years 2 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
151
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KBSE
2007
IEEE
16 years 4 hour ago
2007
IEEE
This paper presents a tool that (i) constructs tree-based models of a program’s behavior during testing and (ii) employs these trees while reordering and reducing a test suite. ...
138
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ICCD
1999
IEEE
15 years 10 months ago
1999
IEEE
High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at det...