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DAGSTUHL
2007
15 years 7 months ago
Diagonal Circuit Identity Testing and Lower Bounds
In this paper we give the first deterministic polynomial time algorithm for testing whether a diagonal depth-3 circuit C(x1, . . . , xn) (i.e. C is a sum of powers of linear funct...
Nitin Saxena
ISQED
2002
IEEE
83views Hardware» more  ISQED 2002»
15 years 10 months ago
A Hybrid BIST Architecture and Its Optimization for SoC Testing
This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...
Gert Jervan, Zebo Peng, Raimund Ubar, Helena Kruus
ATS
2004
IEEE
108views Hardware» more  ATS 2004»
15 years 9 months ago
Rapid and Energy-Efficient Testing for Embedded Cores
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
142
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GLOBECOM
2008
IEEE
16 years 7 days ago
Using Higher Order Cyclostationarity to Identify Space-Time Block Codes
—Research in cognitive radios has renewed interest in tools, such as spectrum estimation and modulation identification, to characterize the radio frequency (RF) environment. The...
Marcus R. DeYoung, Robert W. Heath Jr., Brian L. E...
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
16 years 6 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen