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178
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GECCO
2010
Springer
15 years 10 months ago
2010
Springer
The increase in the complexity of modern software has led to the commensurate growth in the size and execution time of the test suites for these programs. In order to address this...
127
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DFT
2005
IEEE
15 years 11 months ago
2005
IEEE
In this paper, we present two novel methodologies for testing the interconnect fabrics of network-on-chip (NoC) based chips. Both use the concept of recursive testing, with differ...
145
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ISCAS
2005
IEEE
15 years 11 months ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
156
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VTS
2008
IEEE
16 years 5 days ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
145
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ICSM
2008
IEEE
16 years 6 days ago
2008
IEEE
Test-case prioritization is a typical scenario of regression testing, which plays an important role in software maintenance. With the popularity of Web Services, integrating Web S...