4305 search results - page 54 / 861 » The Test of Time |
161
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ISAAC
1992
Springer
15 years 10 months ago
1992
Springer
A (0,1)-matrix satisfies the consecutive ones property if there exists a column permutation such that the ones in each row of the resulting matrix are consecutive. Booth and Lueke...
133
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ATS
2004
IEEE
15 years 9 months ago
2004
IEEE
1 This paper describes a heuristic for system-on-chip test scheduling in an abort-on-fail context, where the test is terminated as soon as a defect is detected. We consider an hybr...
186
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ATVA
2004
Springer
15 years 11 months ago
2004
Springer
Timed Bisimulation Preserving Abstraction for Parametric Time-Interval Automata Akio Nakata, Tadaaki Tanimoto, Suguru Sasaki, Teruo Higashino Department of Information Networking, ...
129
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
154
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COMCOM
2006
15 years 5 months ago
2006
This paper gives an overview of the issues related to the QoS mechanisms under IPv6 and the transition of applications to the new Internet protocol. We describe the implementation...