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138
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ISVLSI
2008
IEEE
16 years 6 days ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
135
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ATS
2009
IEEE
16 years 19 days ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
168
Voted
ISCAS
2011
IEEE
14 years 9 months ago
2011
IEEE
—A method of precise measurement of on-chip analog voltages in a mostly-digital manner, with minimal overhead, is presented. A pair of clock signals is routed to the node of an a...
146
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DATE
2000
IEEE
15 years 10 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
157
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TSMC
2008
15 years 5 months ago
2008
Testing complex manufacturing systems, such as an ASML [1] lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be execu...