4305 search results - page 62 / 861 » The Test of Time |
145
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ICCAD
2000
IEEE
15 years 10 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
176
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JSS
2008
15 years 4 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
172
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DATE
2008
IEEE
16 years 8 days ago
2008
IEEE
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...
146
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TCAD
1998
15 years 5 months ago
1998
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
201
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APN
2005
Springer
15 years 7 months ago
2005
Springer
Abstract. We establish mutual translations between the classes of 1safe timed-arc Petri nets (and its extension with testing arcs) and networks of timed automata (and its subclass ...