4305 search results - page 63 / 861 » The Test of Time |
148
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DSD
2005
IEEE
15 years 11 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
173
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ICIP
1998
IEEE
16 years 7 months ago
1998
IEEE
Optical flow estimation from image sequences has been for several years a mathematical process carried out by general purpose processors in no real time. In this work a specific a...
144
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DAC
2005
ACM
16 years 6 months ago
2005
ACM
Recent study shows that the existing first order canonical timing model is not sufficient to represent the dependency of the gate delay on the variation sources when processing an...
132
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ATS
2003
IEEE
15 years 11 months ago
2003
IEEE
1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is equivalent to independent job scheduling on identical machines and we make use of an exi...
138
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of ...