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ICMCS
2006
IEEE
148views Multimedia» more  ICMCS 2006»
15 years 12 months ago
Hierarchical Load Testing Architecture using Large Scale Virtual Clients
In this work, we develop a hierarchical load testing architecture using large scale virtual clients to reduce the testing time and ensure the stability of the server for distribut...
Bum Lim, Jin Kim, Kwang Shim
COMPSAC
2002
IEEE
15 years 10 months ago
Temporal Modeling of Software Test Coverage
This paper presents a temporal model for the coverage achieved by software testing. The proposed model, which is applicable at any level of the testing hierarchy, can determine th...
Sahra Sedigh-Ali, Arif Ghafoor, Raymond A. Paul
ICCD
2006
IEEE
116views Hardware» more  ICCD 2006»
16 years 2 months ago
RTL Scan Design for Skewed-Load At-speed Test under Power Constraints
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
Ho Fai Ko, Nicola Nicolici
VTS
1996
IEEE
74views Hardware» more  VTS 1996»
15 years 10 months ago
An unexpected factor in testing for CMOS opens: the die surface
In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
Haluk Konuk, F. Joel Ferguson
WSCG
2001
110views more  WSCG 2001»
15 years 7 months ago
Algorithms to Test Ray-Triangle Intersection. Comparative Study
In this article we present an algorithm to determine the intersection between rays and triangles based on the idea of the study of signs with respect to triangles. One of the adva...
Rafael Jesús Segura, Francisco R. Feito