4305 search results - page 68 / 861 » The Test of Time |
167
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DATE
2005
IEEE
15 years 11 months ago
2005
IEEE
— State of the art statistical timing analysis (STA) tools often yield less accurate results when timing variables become correlated due to global source of variations and path r...
158
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ICTAI
2002
IEEE
15 years 10 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
140
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ISSTA
1993
ACM
15 years 10 months ago
1993
ACM
Most of the effort that goes into improving the quality of software paradoxically does not lead to quantitative, measurable quality. Software developers and quality-assurance orga...
159
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VTS
2003
IEEE
15 years 11 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
171
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VLSID
2002
IEEE
16 years 6 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...