4305 search results - page 72 / 861 » The Test of Time |
177
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ISSTA
2004
ACM
15 years 11 months ago
2004
ACM
Continuous testing uses excess cycles on a developer’s workstation to continuously run regression tests in the background, providing rapid feedback about test failures as source...
122
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
156
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KBSE
2005
IEEE
15 years 11 months ago
2005
IEEE
Test factoring creates fast, focused unit tests from slow system-wide tests; each new unit test exercises only a subset of the functionality exercised by the system test. Augmenti...
146
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VTS
2002
IEEE
15 years 10 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
142
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RISE
2005
Springer
15 years 11 months ago
2005
Springer
Abstract. This paper applies the Evolutionary Strategy (ES) metaheuristic to the automatic test data generation problem. The problem consists in creating automatically a set of inp...