4305 search results - page 76 / 861 » The Test of Time |
147
click to vote
ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
151
click to vote
DATE
2005
IEEE
15 years 11 months ago
2005
IEEE
This paper describes two research projects that develop new low-cost techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals. Each project uses commercially ...
196
click to vote
VLSID
2010
IEEE
15 years 3 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
133
click to vote
ATS
2009
IEEE
16 years 21 days ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
142
click to vote
VLSID
2004
IEEE
16 years 6 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...