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SODA
2010
ACM
169views Algorithms» more  SODA 2010»
16 years 3 months ago
Efficiently Decodable Non-adaptive Group Testing
We consider the following "efficiently decodable" nonadaptive group testing problem. There is an unknown string x {0, 1}n with at most d ones in it. We are allowed to t...
Piotr Indyk, Hung Q. Ngo, Atri Rudra
ETS
2007
IEEE
94views Hardware» more  ETS 2007»
16 years 7 days ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
EUROSPI
2007
Springer
16 years 1 days ago
The Impact of Test-Driven Development on Software Development Productivity - An Empirical Study
Test-driven development (TDD) is entering the mainstream of software development. We examined the software development process for the purpose of evaluation of the TDD impact, with...
Lech Madeyski, Lukasz Szala
VTS
2000
IEEE
76views Hardware» more  VTS 2000»
15 years 10 months ago
Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems
Mixed-signal design and test tools are failing to keep apace with the increasing necessity for design exploration at the e arly stages.We outline a methodolo gy and toolset to ena...
Sule Ozev, Alex Orailoglu
GD
2006
Springer
15 years 9 months ago
Planarity Testing and Optimal Edge Insertion with Embedding Constraints
The planarization method has proven to be successful in graph drawing. The output, a combinatorial planar embedding of the so-called planarized graph, can be combined with state-o...
Carsten Gutwenger, Karsten Klein, Petra Mutzel