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DATE
1999
IEEE
111views Hardware» more  DATE 1999»
15 years 10 months ago
Sequential Circuit Test Generation Using Decision Diagram Models
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
Jaan Raik, Raimund Ubar
INFSOF
2008
121views more  INFSOF 2008»
15 years 6 months ago
A test driven approach for aspectualizing legacy software using mock systems
Aspect-based refactoring, called aspectualization, involves moving program code that implements cross-cutting concerns into aspects. Such refactoring can improve the maintainabili...
Michael Mortensen, Sudipto Ghosh, James M. Bieman
ICALP
2001
Springer
15 years 10 months ago
Testing Hypergraph Coloring
In this paper we initiate the study of testing properties of hypergraphs. The goal of property testing is to distinguish between the case whether a given object has a certain prope...
Artur Czumaj, Christian Sohler
ETS
2006
IEEE
119views Hardware» more  ETS 2006»
15 years 12 months ago
On-Chip Test Generation Using Linear Subspaces
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Ramashis Das, Igor L. Markov, John P. Hayes
MTDT
2000
IEEE
137views Hardware» more  MTDT 2000»
15 years 10 months ago
Diagnostic Testing of Embedded Memories Based on Output Tracing
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...