4305 search results - page 85 / 861 » The Test of Time |
167
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CVPR
2005
IEEE
16 years 8 months ago
2005
IEEE
: In many computer vision classification problems, both the error and time characterizes the quality of a decision. We show that such problems can be formalized in the framework of...
140
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ISSAC
1990
Springer
15 years 10 months ago
1990
Springer
Let a system of linear ordinary differential equations of the first order Y' = AY be given, where A is n x n matrix over a field F(X), assume that the degree degx(A) < d a...
146
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GLVLSI
2006
IEEE
15 years 12 months ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
143
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CORR
2010
Springer
15 years 6 months ago
2010
Springer
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
135
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ATS
2005
IEEE
15 years 11 months ago
2005
IEEE
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...