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180
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ASPDAC
2009
ACM
16 years 14 days ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
175
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ASPDAC
1998
ACM
15 years 10 months ago
1998
ACM
Functional debugging often dominates the time and cost of the ASIC system development, mainly due to the limited controllability and observability of the storage elements in desig...
144
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ENTCS
2007
15 years 5 months ago
2007
Modern software is increasingly concurrent, timed, distributed, and therefore, non-deterministic. While it is well known that tests can be generated as LTL or CTL model checker co...
131
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
155
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DAGSTUHL
2004
15 years 7 months ago
2004
Although computer systems penetrate all facets of society, the software running those systems may contain many errors. Producing high quality software appears to be difficult and v...