Abstract. In this paper, we investigate the application of adaptive ensemble models of Extreme Learning Machines (ELMs) to the problem of one-step ahead prediction in (non)stationa...
Mark van Heeswijk, Yoan Miche, Tiina Lindh-Knuutil...
We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
—Property testing is a rapidly growing field of research. Typically, a property testing algorithm proceeds by quickly determining whether an input can satisfy some condition, und...
Igor Kleiner, Daniel Keren, Ilan Newman, Oren Ben-...
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test ...
Scott Ollivierre, Adam B. Kinsman, Nicola Nicolici