4305 search results - page 91 / 861 » The Test of Time |
149
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ESA
1993
Springer
15 years 10 months ago
1993
Springer
A digraph is upward planar if it has a planar drawing such that all the edges are monotone with respect to the vertical direction. Testing upward planarity and constructing upward ...
162
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ICCD
2003
IEEE
16 years 2 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
134
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TIP
2008
15 years 5 months ago
2008
We present a two-stage method for obtaining both phase and object estimates from phase-diversity time series data. In the first stage, the phases are estimated for each time frame...
156
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DATE
2008
IEEE
16 years 13 days ago
2008
IEEE
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
173
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...