4305 search results - page 93 / 861 » The Test of Time |
179
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DATE
1999
IEEE
15 years 10 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
157
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JCP
2006
15 years 6 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
151
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TOOLS
1998
IEEE
15 years 10 months ago
1998
IEEE
Object-orientation has rapidly become accepted as the preferred paradigm for large scale system design. There is considerable literature describing approaches to object-oriented d...
154
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DATE
2009
IEEE
16 years 23 days ago
2009
IEEE
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...
167
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ISNN
2007
Springer
16 years 4 days ago
2007
Springer
This paper presents a new approach to speed up the operation of time delay neural networks for fast code detection. The entire data are collected together in a long vector and then...