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ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
16 years 1 months ago
Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
Mihir R. Choudhury, Quming Zhou, Kartik Mohanram
ICSM
2007
IEEE
15 years 11 months ago
Smart Formatter: Learning Coding Style from Existing Source Code
The quality of identifiers, the coding style and formatting are important aspects that influence program understandings and maintenance. This is confirmed by the presence of se...
Filippo Corbo, Concettina Del Grosso, Massimiliano...
ICALP
2007
Springer
15 years 11 months ago
Linear Problem Kernels for NP-Hard Problems on Planar Graphs
Abstract. We develop a generic framework for deriving linear-size problem kernels for NP-hard problems on planar graphs. We demonstrate the usefulness of our framework in several c...
Jiong Guo, Rolf Niedermeier
115
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ISCAS
2005
IEEE
123views Hardware» more  ISCAS 2005»
15 years 10 months ago
Multiple project wafers for medium-volume IC production
—Multi-project wafer (MPW) is commonly used for low-volume IC production. In this paper, we study whether it can be used for medium-volume production. Cost equations are develope...
Meng-Chiou Wu, Rung-Bin Lin
ISESE
2005
IEEE
15 years 10 months ago
Dialog-based protocol: an empirical research method for cognitive activities in software engineering
This paper proposes dialog-based protocol for the study of the cognitive activities during software development and evolution. The dialog-based protocol, derived from the idea of ...
Shaochun Xu, Václav Rajlich