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ICCAD
2009
IEEE
161views Hardware» more  ICCAD 2009»
14 years 8 months ago
The epsilon-approximation to discrete VT assignment for leakage power minimization
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...
Yujia Feng, Shiyan Hu
TVLSI
2008
197views more  TVLSI 2008»
14 years 10 months ago
Leakage Minimization of SRAM Cells in a Dual-Vt and Dual-Tox Technology
-- Aggressive CMOS scaling results in low threshold voltage and thin oxide thickness for transistors manufactured in deep submicron regime. As a result, reducing the subthreshold a...
Behnam Amelifard, Farzan Fallah, Massoud Pedram