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DATE
2006
IEEE
108views Hardware» more  DATE 2006»
15 years 4 months ago
Test compaction for transition faults under transparent-scan
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
Irith Pomeranz, Sudhakar M. Reddy
ICSE
2010
IEEE-ACM
15 years 3 months ago
Using dynamic execution traces and program invariants to enhance behavioral model inference
Software behavioral models have proven useful for design, validation, verification, and maintenance. However, existing approaches for deriving such models sometimes overgeneraliz...
Ivo Krka, Yuriy Brun, Daniel Popescu, Joshua Garci...
VTS
2000
IEEE
113views Hardware» more  VTS 2000»
15 years 3 months ago
Hidden Markov and Independence Models with Patterns for Sequential BIST
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
Laurent Bréhélin, Olivier Gascuel, G...
DBSEC
2010
129views Database» more  DBSEC 2010»
15 years 6 days ago
Secure Outsourcing of DNA Searching via Finite Automata
This work treats the problem of error-resilient DNA searching via oblivious evaluation of finite automata, formulated as follows: a client has a DNA sequence, and a service provid...
Marina Blanton, Mehrdad Aliasgari
NIPS
2007
15 years 5 days ago
A probabilistic model for generating realistic lip movements from speech
The present work aims to model the correspondence between facial motion and speech. The face and sound are modelled separately, with phonemes being the link between both. We propo...
Gwenn Englebienne, Tim Cootes, Magnus Rattray