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118
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DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
100
Voted
DSD
2009
IEEE
15 years 4 months ago
2009
IEEE
Modern systems are able to put two or more processors on the same die (Chip Multiprocessors, CMP), each with its private caches, while the last level caches can be either private ...
119
Voted
EDBT
2009
ACM
15 years 4 months ago
2009
ACM
Given a set P of products, a set O of customers, and a product p P, a bichromatic reverse skyline query retrieves all the customers in O that do not find any other product in P t...
107
Voted
GLOBECOM
2007
IEEE
15 years 4 months ago
2007
IEEE
Under device failures and maintenance activities, network resources reduce and congestion may arise inside networks. As a result, users experience degraded performance on packet d...
96
Voted
GLVLSI
2007
IEEE
15 years 4 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...