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DFT
2002
IEEE
115views VLSI» more  DFT 2002»
15 years 4 months ago
Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
Sagar S. Sabade, D. M. H. Walker
KDD
2005
ACM
137views Data Mining» more  KDD 2005»
16 years 6 days ago
Pattern-based similarity search for microarray data
One fundamental task in near-neighbor search as well as other similarity matching efforts is to find a distance function that can efficiently quantify the similarity between two o...
Haixun Wang, Jian Pei, Philip S. Yu
MT
2010
110views more  MT 2010»
14 years 10 months ago
Metrics for MT evaluation: evaluating reordering
Translating between dissimilar languages requires an account of the use of divergent word orders when expressing the same semantic content. Reordering poses a serious problem for s...
Alexandra Birch, Miles Osborne, Phil Blunsom
ICDE
2010
IEEE
171views Database» more  ICDE 2010»
15 years 11 months ago
Surrogate Ranking for Very Expensive Similarity Queries
1 We consider the problem of similarity search in applications where the cost of computing the similarity between two records is very expensive, and the similarity measure is not a...
Chris Jermaine, Fei Xu, Mingxi Wu, Ravi Jampani, T...
CSMR
2002
IEEE
15 years 4 months ago
Architecture-Centric Software Evolution by Software Metrics and Design Patterns
It is shown how software metrics and architectural patterns can be used for the management of software evolution. In the presented architecture-centric software evolutionmethod th...
Juha Gustafsson, Jukka Paakki, Lilli Nenonen, A. I...