— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
Assimilation of spatially- and temporally-distributed state observations into simulations of dynamical systems stemming from discretized PDEs leads to inverse problems with high-di...
Omar Bashir, Omar Ghattas, Judith Hill, Bart G. va...
This paper addresses the need to integrate formal assertions into the modeling, implementation, and testing of statechart based designs. The paper describes an iterative process f...
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
Glenn H. Chapman, Israel Koren, Zahava Koren, Jozs...