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» The state of peer-to-peer simulators and simulations
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ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
15 years 5 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
VTS
2007
IEEE
95views Hardware» more  VTS 2007»
15 years 5 months ago
Delay Test Quality Evaluation Using Bounded Gate Delays
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
Soumitra Bose, Vishwani D. Agrawal
ICCS
2007
Springer
15 years 5 months ago
Hessian-Based Model Reduction for Large-Scale Data Assimilation Problems
Assimilation of spatially- and temporally-distributed state observations into simulations of dynamical systems stemming from discretized PDEs leads to inverse problems with high-di...
Omar Bashir, Omar Ghattas, Judith Hill, Bart G. va...
RSP
2006
IEEE
125views Control Systems» more  RSP 2006»
15 years 5 months ago
Creation and Validation of Embedded Assertion Statecharts
This paper addresses the need to integrate formal assertions into the modeling, implementation, and testing of statechart based designs. The paper describes an iterative process f...
Doron Drusinsky, Man-tak Shing, Kadir Alpaslan Dem...
DFT
2005
IEEE
89views VLSI» more  DFT 2005»
15 years 4 months ago
On-Line Identification of Faults in Fault-Tolerant Imagers
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
Glenn H. Chapman, Israel Koren, Zahava Koren, Jozs...