This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
Low power is a primary concern in the field of wireless sensor networks. Bluetooth has often been labeled as an inappropriate technology in this field due to its high power consump...
Abstract—It is important to reduce the Optical Proximity Correction (OPC) runtime while maintaining a good result quality. In this paper, we obtain a better formula, which theore...
FAdo is an ongoing project which aims to provide a set of tools for symbolic manipulation of formal languages. To allow highlevel programming with complex data structures, easy pro...
It is well-known that the discrete Fourier transform (DFT) of a finite length discrete-time signal samples the discrete-time Fourier transform of the same signal at equidistant p...