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VLSID
2003
IEEE
96views VLSI» more  VLSID 2003»
15 years 10 months ago
Design Of A Universal BIST (UBIST) Structure
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
EWSN
2006
Springer
15 years 9 months ago
Power Management for Bluetooth Sensor Networks
Low power is a primary concern in the field of wireless sensor networks. Bluetooth has often been labeled as an inappropriate technology in this field due to its high power consump...
Luca Negri, Lothar Thiele
ICCAD
2007
IEEE
129views Hardware» more  ICCAD 2007»
15 years 6 months ago
A novel intensity based optical proximity correction algorithm with speedup in lithography simulation
Abstract—It is important to reduce the Optical Proximity Correction (OPC) runtime while maintaining a good result quality. In this paper, we obtain a better formula, which theore...
Peng Yu, David Z. Pan
WIA
2009
Springer
15 years 4 months ago
FAdo and GUItar
FAdo is an ongoing project which aims to provide a set of tools for symbolic manipulation of formal languages. To allow highlevel programming with complex data structures, easy pro...
André Almeida, Marco Almeida, José A...
ICASSP
2008
IEEE
15 years 4 months ago
Alternatives to the discrete fourier transform
It is well-known that the discrete Fourier transform (DFT) of a finite length discrete-time signal samples the discrete-time Fourier transform of the same signal at equidistant p...
Doru-Cristian Balcan, Aliaksei Sandryhaila, Jonath...