8 search results - page 2 / 2 » Thermal simulation techniques for nanoscale transistors |
TCAD
2008
13 years 6 months ago
2008
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
TVLSI
2010
13 years 29 days ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...