This paper presents a study of the thermal spreading resistance Rth of a small heat source on a conductive substrate subject to bottomside convective cooling. This problem has bee...
Heat removal and power delivery have become two major reliability concerns in 3D stacked IC technology. For thermal problem, two possible solutions exist: thermal-through-silicon-...
With technology scaling, power dissipation and localized heating in global and semi-global bus wires are becoming increasingly important, and this necessitates the development of ...
In this paper, we propose two methods used in 3D IC placement that effectively exploit the die-to-die thermal coupling in the stack. First, TSVs are spread on each die to reduce t...
Full-chip thermal monitoring is an important and challenging issue in today’s microprocessor design. In this paper, we propose a new information-theoretic framework to quantitat...
Huapeng Zhou, Xin Li, Chen-Yong Cher, Eren Kursun,...