28 search results - page 5 / 6 » Three-Dimensional Simulation of Semiconductor Devices |
PATMOS
2007
Springer
14 years 11 days ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
VRST
2003
ACM
13 years 11 months ago
2003
ACM
Researchers have had great success using motion capture tools for controlling avatars in virtual worlds. Another current of virtual reality research has focused on building collab...
ISCA
2000
IEEE
13 years 10 months ago
2000
IEEE
The doubling of microprocessor performance every three years has been the result of two factors: more transistors per chip and superlinear scaling of the processor clock with tech...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
TVLSI
2010
13 years 28 days ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...